Up
8 sec
28 sec
36 sec
Film Height after 30 sec
Pressure Distribution at 0 sec
"Three-Dimensional Chemical-Mechanical Polishing Process Model by BEM", Electrochem. Soc. & Jpn, Appl. Phys. Joint Internl. Meeting, Proc. 3rd Internl. Symp. CMP in IC Device Manufacturing, 593 (1999) "A Model of Stacked Polishing Pad for 3-D CMP Simulation", Electrochem. Soc. & Jpn, Appl. Phys. Joint Internl. Meeting, Proc. 3rd Internl. Symp. CMP in IC Device Manufacturing, 625 (1999)
"A Model of Stacked Polishing Pad for 3-D CMP Simulation", Electrochem. Soc. & Jpn, Appl. Phys. Joint Internl. Meeting, Proc. 3rd Internl. Symp. CMP in IC Device Manufacturing, 625 (1999)
Select the items that apply, and then let us know how to contact you.
Send product literature Send company literature Have a salesperson contact me